Common Challenges We Solve
Atomic Force Microscopy has two major functionalities: force measurement and imaging. The forces between the probe and sample are measured as a function of their mutual separation. For imaging, the probe’s reaction to forces that the sample imposes on it can be used to form a three-dimensional topography image. This technique is further enhanced when varying wavelengths of the infrared light source are applied to the area of investigation. The absorption and subsequent expansion is measured by the tapping probe cantilever and this information provides a Fourier-transform infrared spectroscopy spectrum, providing insight about the material being inspected.
- Average power of 200mW
- Wavelength tunable from 9 to 11µm
- FTIR identification of polymers
- Mechanical property mapping
- Chemical imaging and material characterization
- Continuous Wave or Pulsed operation
- Nanometer-scale spatial resolution